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Description

FIB6-4005 Pack, 42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS 42N m, 320kHz, 10nm Tip Radius, 400nm Wide Spike @ 6m High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 15: 1 at 6um from tip apex. Tip Geometry: High Aspect Ratio Tip Height: 10 15 Front Angle: 1. 7 0. 5 Back Angle: 1. 7 0. 5 Side Angle: 1. 7 0. 5 Tip Radius (Nom): 10 Tip Radius (Max): 15

resulting in six unique nominal values for force constant and resonant frequency

55 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Magnetic CoCr Back Side Coating: Reflective CoCr

Al and Stainless Steel grids are packaged in 25grids/vial

5 Front Angle: 15 ± 2

160 lines/mm crossed lines

05mm Packaging: 100 grids/vial for standard Cu

Non-Magnetic Sample Holder

The 50µm pitch patterns are useful from 100 - 1000x magnifications

65 Cantilever Geometry: Triangular Cantilevers Number: 4

High resolution electrical imaging with an ultra-sharp conductive tip

- Quantity 10

Usability: The calibrated pattern covers the entire standard