Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Machine model (MM) PAS 015 b) Type of wheel:

b) Type of wheel:

BS 4868 also discusses freedom from defects which contributes to the performance characteristics of aluminium sheets ensuring their reliability

Annex E contains notes on type tests

BS 1192‑4 defines the UK usage of COBie

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Machine model (MM) PAS 015 b) Type of wheel:1 Scope This part of IEC 60749 establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This