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CS-20NGXYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height DESCRIPTION XYZ Calibration Nanogrid; Arrays with Down to 500nm Pitch; 20nm Height Why XYZ Calibration Nanogrid? In order to make the most of their measurement capabilities, AFM systems need to be properly calibrated. The more accurate your calibration standard, the more accurate AFM measurement results can be achieved. In this respect, nanogrid calibration standards allow the most

The Al Reflective coating increases the laser signal (A+B) by up to 2

16380-25 - Ø15mm

All Lift-Out Grids have multiple indexed mounting positions for easy identification and positioning in the TEM

High Resolution Force Modulation AFM Probe

The PELCO® Universal SEM Sample Holder Set extends the capabilities of your SEM by offering convenient sample holders for larger or awkwardly shaped samples

Selection of 3 block type test gratings with different step heights intended for Z-axis calibration of scanning probe microscopes and linearity measurements

HS-20MG - 2% height accuracy

The Co particles are flattened half spheres (droplets) with the radius typically larger than the height

16084-2 - PELCO Tabs™

4 clips<16326-80 - PELCO SEMClip™

For standard grid materials such as Cu

Powder on carbon fiber mat tab

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