Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level Ingestion-build-181247 ISO 7526 is applicable to

ISO 7526 is applicable to normal production operations

Figure 1 – Product lifecycle

BS EN IEC 60674 is an international standard on specifications for plastic films for electrical purposes

BS EN 599-2 is used in conjunction with EN 599-1

Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level Ingestion-build-181247 ISO 7526 is applicable to1 Scope This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, opto electronic devices, hybrid integrated circuits (HICs), and