SEM Magnification Standard and Stage Micrometer MRS-4 - Cleaning and Re-calibration Service

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Description

SEM Magnification Standard and Stage Micrometer MRS-4 - Cleaning and Re-calibration ServiceDESCRIPTION MRS 4 X Y R Cleaning, Re coating and Re calibration MRS 4 X Y Z R Cleaning, Re coating and Re calibration MRS 3 4 5 Cleaning and Re coating only The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and

Square Mesh Pitch µm Hole µm Bar µm % Transmission 75 339 284 55 70 100 254 204 50 65 200 127 90 37 50 300 85 54 31 40 400 64 38 26 35

35mm) barb fitting

enabling imaging of the fragile biological samples without deforming the samples’ fundamental atomic structures

HOPG grade ZYB

Useful sizes for AFM/STM

The coating on the back side of the cantilever compensates for the stress created by the front side coating and also enhances laser reflectivity by a factor of up to 2

Frequency Ratio Ft/Fo: 17

25 microns of gold

the pattern height is 70nm

For standard grid materials such as Cu

Bruker's Value Line Long-Lever TappingMode™ imaging probes

Resonant frequency is 100 kHz in air

Exchange/Return Notes