Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST Ingestion-build-232773 Positioning of the cylinder

Positioning of the cylinder

Annex A (normative) Determination and calculation of water absorption

but remains current until 2009

3 Data sheet

Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST Ingestion-build-232773 Positioning of the cylinder1 Scope and object The unbiased highly accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non hermetically packaged solid state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external