Ge Substrate: (100) 10x10 x 0.5 mm , 1SP, P type Ga doped,R:1-5 ohm.cm Battery Analyzer/Cycler With this testing kit

With this testing kit

longer cycling durability

please contact us for a distributor price

180mm Tabs 25ms Welding Time 55% Welding Current 0

Ge Substrate: (100) 10x10 x 0.5 mm , 1SP, P type Ga doped,R:1-5 ohm.cm Battery Analyzer/Cycler With this testing kitGe Wafer Specification Growing Method: CZ Wafer Size: 10 x 10 x0. 5 mm Surface Polishing: one side epi polished Orientation: (100) Surface roughness: RMS or Ra:~ 10 A(By AFM) Doping: Ga doped Conductor type: P type Resistivity: 1 5 Ohms cm (If you would like to measure the resistivity accurately, please order our Portable 4 Probe Resistivity Testing Instrument.) Package: under 1000 class clean room in wafer container Related Product Other Crystal