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Description

Block Test Gratings for Z-axisDESCRIPTION Selection of 3 block type test gratings with different step heights intended for Z axis calibration of scanning probe microscopes and linearity measurements. Structure: Si Wafer with SiO2 layer for grating Pattern type: 1 Dimensional (in Z axis direction) Step heights: 201. 5nm for TGZ 20 1102nm for TGZ 100 5203nm for TGZ 500 Period: 3 0. 01m Chip size: 5 x 5 x 0. 5mm Effective area: Central square of 3 x 3mm Note: Values for step heights

These splash guards hold and seal the cantilever holder and seal on the end of a close-loop

This sample is conductive and allows a bias potential to be applied between the tip and sample

Disc diameter: 3mm

1mm thickness

Solid Metal Probe

using cartridge model 806-012-725

This Non-Magnetic Cantilever Holder supports contact AFM and TappingMode operation in air on the Dimension/Bioscope SPM heads

Aluminum reflective coating on the backside of the cantilever

similar in geometry to standard Silicon AFM probes but incorporate a resistive heater at the end of the cantilever

75 Cantilever Thickness (RNG): 1

The thickness is approximately 25µm for Mo and Al

Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM)