Semiconductor devices. Mechanical and climatic test methods - Latch-up test Ingestion-build-180956 — magnesium oxide (MgO)

— magnesium oxide (MgO)

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Contents of BS ISO/IEC 19793:

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Semiconductor devices. Mechanical and climatic test methods - Latch-up test Ingestion-build-180956 — magnesium oxide (MgO)What is BS EN 60749 29 Latch up test of integrated circuits for semiconductor devices about? BS EN 60749 29 is the 29th part of an international standard used for semiconductor devices that specifies the test method for integrated circuits. By using BS EN 60749 29 you can manufacture good quality semiconductor devices. BS EN 60749 29 covers the I test and the overvoltage latch up testing of integrated circuits. This test is classified as destructive.